Andreas Kyritsakis, John P. Xanthakis, Taryl L. Kirk, and Danilo Pescia, A theoretical calculation of the electrical characteristics of the NFESE microscopy, Proceedings – IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference

Andreas Kyritsakis, John P. Xanthakis, Taryl L. Kirk, and Danilo Pescia, Lateral resolution of the NFESE microscopy and the existence of self focusing of electrons, Proceedings – IVNC 2011: 2011 24th International Vacuum Nanoelectronics Conference

Taryl L. Kirk, “Near field emission scanning electron microscopy,” in Microscopy: Science, Technology, Applications and Education (Formatex, Badajoz, 2010).

Taryl L. Kirk, “Near Field Emission Scanning Electron Microscopy,” Volume 9 of the series Applied Electron Microscopy – Angewandte Elekronenmikroskopie (Logos Verlag, Berlin, 2010).

Andreas Kyritsakis, Gerassimos C. Kokkorakis, John P. Xanthakis, Taryl L. Kirk, and Danilo Pescia, Self focusing of field emitted electrons at an ellipsoidal tip, Applied Physics Letter 97, 023104 (2010).

Note: selected for the Virtual Journal of Nanoscale Science & Technology, Nanoscale Science and Technology volume 22, issue 4 (2010)

Taryl L. Kirk, STM vs. NFESEM – On epitaxial metal overlayers, G.I.T. Laboratory Journal Europe 14 (5-6), 18 (2010). (invited)
*Top 5 of the most read articles

Taryl L. Kirk, High resolution field emission scanning electron microscopy, European Conference on Applications of Surface and Interface Analysis 2009, at Antalya, Turkey

Taryl L. Kirk, Urs Ramsperger, and Danilo Pescia, “Low-voltage field emission scanning electron microscope,” WO patent 2009100753, Aug. 20, 2009.

Taryl L. Kirk, Lorenzo G. De Pietro, Olivier Scholder, Urs Ramsperger, and Danilo Pescia, Evidence of non-planar field emission via secondary electron detection in near field emission scanning electron microscopy, Applied Physics Letter 94, 153502 (2009).

Note: selected for the Virtual Journal of Nanoscale Science & Technology, Nanoscale Science and Technology volume 19, issue 17 (2009)

Taryl L. Kirk, Urs Ramsperger, Lorenzo G. De Pietro, Olivier Scholder, Thomas Bahler, Urs Maier, and Danilo Pescia, High resolution scanning electron microscopy using field-emitted spin polarized electrons, Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International, 91 (2009) ISBN: 978-1-4244-3587-6.

Olivier Scholder, Taryl L. Kirk, Lorenzo G. De Pietro, Thomas Bahler, Urs Ramsperger, and Danilo Pescia, Image contrast dependence on the field emitter in near field emission scanning electron microscopy, Vacuum Nanoelectronics Conference, 2009. IVNC 2009. 22nd International, 91 (2009) ISBN: 978-1-4244-3587-6.

Taryl L. Kirk, Lorenzo G. De Pietro, Urs Ramsperger, and Danilo Pescia, Near Field Emission SEM, Imaging and Microscopy 11 (1), 35 (2009).

Taryl L. Kirk, Urs Ramsperger, and Danilo Pescia, Near Field Emission Scanning Electron Microscopy, Journal of Vacuum Science and Technology B 27, 152 (2009).

Note: selected for the Virtual Journal of Nanoscale Science & Technology, Nanoscale Science and Technology volume 19, issue 6 (2009)
*Top 20 most downloaded articles February 2009

Taryl L. Kirk, Lorenzo G. De Pietro, Danilo Pescia, and Urs Ramsperger, Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy, Ultramicroscopy 109, 463 (2009).

Olav Hellwig, Taryl L. Kirk, Jeffrey B. Kortright, Andreas Berger, and Eric E. Fullerton, A new phase diagram for layered antiferromagnetic films, Nature Materials 2,112-116 (2003).

Taryl L. Kirk, Olav Hellwig, and Eric E. Fullerton, Coercivity mechanisms in positive exchange-biased Co films and Co/Pt multilayers, Physical Review B, Vol. 65, 224426 (2002).

Aviad Frydman, Taryl L. Kirk, and Robert C. Dynes, Superparamagnetism in discontinuous Ni films, Solid State Communication 114, 481-486 (2000).

Solomon I. Woods, Andrew S. Katz, Taryl L. Kirk, Marcio C. de Andrade, M. Brian Maple, and Robert C. Dynes, Investigation of Nd-Ce-Cu-O Planar Tunnel Junctions Bicrystal Grain Boundary Junctions, IEEE Transactions on Applied Superconductivity, Vol. 9, No. 2, Part 3, 3917 (1999).